Modern semiconductor test sets have to be fast, resilient, and operator-proof.
Parallelized test and data handling so software overhead stops limiting throughput and the tool is gated by motion and measurement physics instead.
Local-first buffering with background uploads and retry logic so probers keep running through network or database interruptions without data loss.
Ele If your entire factory points to one shared executable, one bad update can take down production.
Version targeting controlled through a central database, with tools self-updating to the assigned version and deterministic rollback by reverting database entries.
Test records tied to the specific prober and the exact software version that executed the test, enabling lot/wafer/die traceability.
We build safety-critical test sets, embedded controls, and the software around them, then deliver the documentation and validation your team needs to run it, trust it, and maintain it.
We build safety-critical test sets, embedded controls, and the software around them, then deliver the documentation and validation your team needs to run it, trust it, and maintain it.
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